This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.

Activity Details

77 * ! Sun, 8/1/2010, 4:00 PM - 5:50 PM CC-202 (West)
Reliability Modeling and Design — Contributed Papers
Section on Physical and Engineering Sciences , Section on Quality and Productivity
Chair(s): Allan T. Mense, Raytheon Company
4:05 PM Reliability Data Analysis for Designed Experiments Laura June Freeman, Virginia Tech ; Geoffrey Vining, Virginia Tech
4:20 PM Flexible Distribution Modeling and Efficient Test Effort Allocation in Inkjet Pen Development Robert O'Donnell, Hewlett-Packard
4:35 PM A Life-Time Model with Random Number of Components in a Series System Ram C. Tripathi, The University of Texas at San Antonio ; Ramesh C. Gupta, University of Maine
4:50 PM Failure Rate of the Mixture of Two Skew Normal Variables Pushpa L. Gupta, University of Maine ; Ramesh C. Gupta, University of Maine
5:05 PM Small Sample Tests for Shape Parameter(s) of Gamma Distributions — Jerome Keating, The University of Texas at San Antonio ; Dulal Bhaumik, University of Illinois at Chicago ; Robert D. Gibbons, University of Illinois at Chicago ; Kush Kapur, University of Illinois at Chicago
5:20 PM Floor Discussion



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