This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.

Abstract Details

Activity Number: 77
Type: Contributed
Date/Time: Sunday, August 1, 2010 : 4:00 PM to 5:50 PM
Sponsor: Section on Physical and Engineering Sciences
Abstract - #309057
Title: Flexible Distribution Modeling and Efficient Test Effort Allocation in Inkjet Pen Development
Author(s): Robert O'Donnell*+
Companies: Hewlett-Packard
Address: 1000 NE Circle Blvd, Corvallis, OR, 97330,
Keywords: Gamma-Poisson ; Monte-Carlo ; Reliability ; Test ; Allocation

Inkjet pen development generates a wide range of data which at times do not lend themselves to convenient distribution models (e.g. normal, binomial, Poisson). Mixture distributions like the Gamma-Poisson are shown to provide valuable flexibility to the data analysis process.

Budgeting for reliability testing in product development can involve making test effort allocation tradeoffs among different tests. A process incorporating historical reliability information, Monte Carlo simulation, cost-to-test data, and cost-to-fix data is developed to quantify these decisions.

The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.

Back to the full JSM 2010 program

2010 JSM Online Program Home

For information, contact or phone (888) 231-3473.

If you have questions about the Continuing Education program, please contact the Education Department.