This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.
Abstract Details
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Activity Number:
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77
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Type:
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Contributed
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Date/Time:
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Sunday, August 1, 2010 : 4:00 PM to 5:50 PM
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Sponsor:
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Section on Physical and Engineering Sciences
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| Abstract - #307580 |
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Title:
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Reliability Data Analysis for Designed Experiments
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Author(s):
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Laura June Freeman*+ and Geoffrey Vining
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Companies:
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Virginia Tech and Virginia Tech
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Address:
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403 Hutcheson Hall, Blacksburg, VA, 24061,
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Keywords:
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Lifetime Data ;
Reliability ;
Design of Experiments ;
Weibull Distribution ;
Minitab
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Abstract:
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Product reliability is an important characteristic for all manufactures, engineers and consumers. Industrial statisticians have been planning experiments for years to improve product quality and reliability. However, rarely do experts in the field of reliability have expertise in design of experiments (DOE) and the implications that experimental protocol have on data analysis. Additionally, statisticians who focus in DOE rarely work with reliability data. This paper is an attempt to bridge that divide. We provide a new, yet simple, analysis technique for reliability data from designed experiments. The technique is illustrated on a popular reliability data set originally from Zelen (1959). This paper discusses implications of using previous analysis methods versus our new approach to the analysis problem.
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Authors who are presenting talks have a * after their name.
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