|
JSM Activity #109This is the preliminary program for the 2005 Joint Statistical Meetings in Minneapolis, Minnesota. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 7-10, 2005); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions. To View the Program: You may choose to view all activities of the program or just parts of it at any one time. All activities are arranged by date and time. |
|
|
Legend: = Applied Session,
= Theme Session,
= Presenter |
109 | Mon, 8/8/05, 8:30 AM - 10:20 AM | MCC-103 E |
Degradation Modeling and Crack Propogation - Contributed - Papers | ||
Section on Physical and Engineering Sciences, Section on Quality and Productivity | ||
Chair(s): Wai F. Chiu, Los Alamos National Laboratory | ||
8:35 AM | On Yield Modeling in the Semiconductor Industry — Kevin Anderson, Intel Corporation | |
8:50 AM | Time Series Modeling of Daily Accumulated Degradation Due to Outdoor Weathering — Victor Chan, Western Washington University; William Q. Meeker, Iowa State University | |
9:05 AM | Estimation Error Comparisons of Failure Distribution for Accelerated Degradation Tests — Shuen-Lin Jeng, Tunghai University | |
9:20 AM | Degradation Models and Implied Lifetime Distributions — Paul Kvam, Georgia Institute of Technology; Suk Joo Bae, University of Tennessee | |
9:35 AM | Projecting Hazard Rates for Aging Aircraft — Peter Hovey, University of Dayton; Alan P. Berens, University of Dayton | |
9:50 AM | A New Compound Fading Model for Wireless Communication Systems — Kaisheng Song, Florida State University | |
10:05 AM | Advanced Statistical Methods for Assessment of Probability of Detection — Yurong Wang, Iowa State University; William Q. Meeker, Iowa State University | |
JSM 2005
For information, contact jsm@amstat.org
or phone (888) 231-3473. If you have questions about the Continuing Education program,
please contact the Education Department. |