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243 * Mon, 8/5/2013, 2:00 PM - 3:50 PM CC-512c
Reliability Testing and Prediction — Contributed Papers
Section on Physical and Engineering Sciences , Quality and Productivity Section
Chair(s): Yili Hong, Virginia Polytechnic Institute & State University
2:05 PM Optimal Design for Accelerated Destructive Degradation Tests Chih-Chun Tsai, Tamkang University ; Sheng-Tsaing Tseng, Institute of Statistics, National Tsing-Hua University ; Narayanaswamy Balakrishnan, McMaster University ; Chien-Tai Lin, Tamkang University
2:20 PM Better Confidence Limits for System Reliability Wayne Nelson, Wayne Nelson Stat Consulting ; J. Brian Hall, U.S. Army, Office of the Secretary of Defense
2:35 PM Product Component Genealogy Modeling and Warranty Return Prediction Caleb B. King, Virginia Polytechnic Institute & State University ; Yili Hong, Virginia Polytechnic Institute & State University ; William Q. Meeker, Iowa State University
2:50 PM Lower Prediction and Tolerance Bounds in Accelerated Life Testing for the Rayleigh Distribution Ananda Jayawardhana, Pittsburg State University ; Yang Song, Department of Statistics, University of Illinois Urbana-Champagne
3:05 PM Nonparametric Tolerance Intervals to Evaluate Reliability of Two Respiration Devices with Skewed Data Xuan Wang, Baylor healthcare system
3:20 PM Floor Discussion



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