Abstract Details
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Activity Number:
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243
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Type:
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Contributed
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Date/Time:
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Monday, August 5, 2013 : 2:00 PM to 3:50 PM
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Sponsor:
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Section on Physical and Engineering Sciences
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| Abstract - #309877 |
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Title:
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Better Confidence Limits for System Reliability
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Author(s):
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Wayne Nelson*+ and J. Brian Hall
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Companies:
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Wayne Nelson Stat Consulting and U.S. Army, Office of the Secretary of Defense
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Keywords:
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system reliability ;
confidence limits ;
component life data ;
maximum likelihood ;
likelihood ratio limits
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Abstract:
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This paper presents better confidence limits for the reliability of a complex system, when there are data on the life of system components. In particular, the paper presents the maximum likelihood estimate and the likelihood ratio confidence limits for system reliability. This methodology is illustrated with an application to an Army system.
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Authors who are presenting talks have a * after their name.
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