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JSM Activity #457This is the preliminary program for the 2005 Joint Statistical Meetings in Minneapolis, Minnesota. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 7-10, 2005); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions. To View the Program: You may choose to view all activities of the program or just parts of it at any one time. All activities are arranged by date and time. |
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Legend: = Applied Session,
= Theme Session,
= Presenter |
457 | Wed, 8/10/05, 2:00 PM - 3:50 PM | MCC-211 A |
Reliability and Survival Modelling - Contributed - Papers | ||
Section on Physical and Engineering Sciences, Section on Quality and Productivity | ||
Chair(s): Vivek Ajmani, General Mills, Inc. | ||
2:05 PM | The Eyring Rate Reaction Model and Its Use in Sensitivity Analysis — Haiming Ma, Iowa State University; William Q. Meeker, Iowa State University | |
2:20 PM | The Performance of Hazard Plotting in Estimating the Parameters of a Weibull Life Distribution in the Presence of an Independent Competing Weibull Failure Mode — John I. McCool, Pennsylvania State Great Valley; Edward Romanowski, QVC, Inc. | |
2:35 PM | Weibull Confidence Bounds with Few or Zero Failures — Ulrike Genschel, University of Dortmund; William Q. Meeker, Iowa State University | |
2:50 PM | Bivariate Weibull Reliability/Survival Models — Yi Han, Auburn University; Mark Carpenter, Auburn University; Norou Diawara, Auburn University | |
3:05 PM | Beta-Weibull Distribution and Its Applications — Felix Famoye, Central Michigan University; Carl Lee, Central Michigan University | |
3:20 PM | Generalized Log-logistic Families of Lifetime Distributions — James Gleaton, University of North Florida; James Lynch, University of South Carolina | |
3:35 PM | Floor Discussion | |
JSM 2005
For information, contact jsm@amstat.org
or phone (888) 231-3473. If you have questions about the Continuing Education program,
please contact the Education Department. |