JSM 2005 - Toronto

Abstract #304106

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Activity Number: 457
Type: Contributed
Date/Time: Wednesday, August 10, 2005 : 2:00 PM to 3:50 PM
Sponsor: Section on Physical and Engineering Sciences
Abstract - #304106
Title: Bivariate Weibull Reliability/Survival Models
Author(s): Yi Han*+ and Mark Carpenter and Norou Diawara
Companies: Auburn University and Auburn University and Auburn University
Address: Department of Mathematics and Statistics, Auburn, AL, 36830,
Keywords: Bivariate Lifetimes ; Bivariate Exponential ; Survival ; Dirac Delta ; Maximum Likelihood
Abstract:

Much research has been conducted throughout the last 30 years in the development and characterization of bivariate survival distributions. Typically, the multivariate distribution is derived assuming the marginal distributions are of some specified lifetime family. In this paper, we examine various bivariate exponential models, including a recently developed model, and Weibull models generated from their respective exponential models. In addition, a new bivariate Weibull model is proposed. Bivariate parameter estimation, with and without censoring, is developed and applied to real and simulated data. Examples are drawn from biomedical research and engineering.

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Revised March 2005