JSM 2005 Online Program

Abstract #304169

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Activity Number:	457
Type:	Contributed
Date/Time:	Wednesday, August 10, 2005 : 2:00 PM to 3:50 PM
Sponsor:	Section on Physical and Engineering Sciences
Abstract - #304169
Title:	The Eyring Rate Reaction Model and Its Use in Sensitivity Analysis
Author(s):	Haiming Ma*+ and William Q. Meeker
Companies:	Iowa State University and Iowa State University
Address:	64 A Schilletter Village, Ames, IA, 50010, United States
Keywords:	Accelerated Failure-Time ; Arrhenius ; Eyring ; Sensitivity Analysis ; SPLIDA
Abstract:	This paper investigates models for temperature acceleration. First, we describe and investigate the properties of the physics-based Eyring rate reaction model and compare it with the empirical Arrhenius model. Then, using temperature-accelerated life data, we illustrate how to analyze the data using the Arrhenius and Eyring models. Sensitivity analysis to assess the Arrhenius model uncertainty, within the frame of the Eyring model, was performed using available SPLIDA commands by transforming the failure-time. The results showed the extrapolations by the Arrhenius and Eyring models are different. The difference is, however, small for the example data. A visual link between a likelihood profile and data fit was established. This link may serve as a routine procedure to analyze the Eyring model with accelerated life tests.

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