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559 * Thu, 8/11/2022, 10:30 AM - 12:20 PM CC-141
Spectral Analysis, Process Monitoring, and Sampling — Contributed Papers
Section on Physical and Engineering Sciences
Chair(s): Arman Sabbaghi, Purdue University
10:35 AM Adaptive Peak Fitting of Atom Probe Tomography Spectra
David Newton, National Institute of Standards and Technology; Frederick Meisenkothen, National Institute of Standards and Technology
10:50 AM Assessing Similarity of Raman Spectra
Hacene Boukari, Delaware State University; Yahira Lopez, Delaware State University; Mohamed Salih, Delaware State University; Fatima Boukari, Delaware State University; Cleon Barnett, Alabama State University; Jobayer Hossain, Nemours Children's Health
11:05 AM Analysis of Transition Edge Sensor Pulse Height Spectra
Kevin J Coakley, National Institute of Standards and Technology
11:20 AM Scientific Model Building Vs Mathematic Approaches to Statistics: With Applications from Process Monitoring (Often Using Examples with a Headstart, Lucas and Crosier, (1982))
James M. Lucas, J. M. Lucas and Associates
11:35 AM Research Synthesis with Missing Uncertainties
Andrew Leo Rukhin, National Institute of Standards and technology
11:50 AM Population Obfuscation: The Problem and Some Solutions
Michael Frey, National Institute of Standards and Technology; Adam Wunderlich, National Institute of Standard and Technology; Kyle Caudle, South Dakota School of Mines and Technology; Randy Hoover, South Dakota School of Mines and Technology; Lucas Koepke, National Institute of Standards and Technology; David Newton, National Institute of Standards and Technology
12:05 PM Floor Discussion