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Activity Number: 354 - Experimental Design and Reliability
Type: Contributed
Date/Time: Thursday, August 12, 2021 : 10:00 AM to 11:50 AM
Sponsor: Quality and Productivity Section
Abstract #318349
Title: Bayesian Designs for Progressively Type-I Censored Simple Step-Stress Accelerated Life Tests Under Cost Constraint and Order-Restriction Based on a Three-Parameter Gamma Prior
Author(s): Crystal Dawn Wiedner* and David Han
Companies: University of Texas at San Antonio and UTSA
Keywords: accelerated life tests; Bayesian analysis; design of experiments; cost constraint; progressive Type-I censoring; step-stress loading

In this work, we investigate order-restricted Bayesian cost constrained design optimization for progressively Type-I censored simple step-stress accelerated life tests with exponential lifetimes under continuous inspections. Previously we showed that using a three-parameter gamma distribution as a conditional prior ensures order restriction for parameter estimation and that the conjugate-like structure provides computational simplicity. Adding on to our Bayesian design work, we explore incorporating a cost constraint to various criteria based on Shannon information gain and the posterior variance-covariance matrix. We derive the formula for expected termination time and expected total cost and propose estimation procedures for each. We conclude with results and a comparison of the efficiencies for the constrained vs. unconstrained tests from an application of these methods to an extension of our previous simulation study.

Authors who are presenting talks have a * after their name.

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