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Activity Number:
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354
- Experimental Design and Reliability
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Type:
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Contributed
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Date/Time:
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Thursday, August 12, 2021 : 10:00 AM to 11:50 AM
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Sponsor:
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Quality and Productivity Section
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Abstract #318349
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Title:
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Bayesian Designs for Progressively Type-I Censored Simple Step-Stress Accelerated Life Tests Under Cost Constraint and Order-Restriction Based on a Three-Parameter Gamma Prior
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Author(s):
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Crystal Dawn Wiedner* and David Han
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Companies:
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University of Texas at San Antonio and UTSA
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Keywords:
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accelerated life tests;
Bayesian analysis;
design of experiments;
cost constraint;
progressive Type-I censoring;
step-stress loading
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Abstract:
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In this work, we investigate order-restricted Bayesian cost constrained design optimization for progressively Type-I censored simple step-stress accelerated life tests with exponential lifetimes under continuous inspections. Previously we showed that using a three-parameter gamma distribution as a conditional prior ensures order restriction for parameter estimation and that the conjugate-like structure provides computational simplicity. Adding on to our Bayesian design work, we explore incorporating a cost constraint to various criteria based on Shannon information gain and the posterior variance-covariance matrix. We derive the formula for expected termination time and expected total cost and propose estimation procedures for each. We conclude with results and a comparison of the efficiencies for the constrained vs. unconstrained tests from an application of these methods to an extension of our previous simulation study.
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Authors who are presenting talks have a * after their name.
