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Activity Number: 354 - Experimental Design and Reliability
Type: Contributed
Date/Time: Thursday, August 12, 2021 : 10:00 AM to 11:50 AM
Sponsor: Section on Physical and Engineering Sciences
Abstract #318223
Title: Design Optimization for the Step-Stress Accelerated Degradation Tests based on Exponential Dispersion Process
Author(s): David Han*
Companies: UTSA
Keywords: Accelerated degradation test; design optimization; Exponential dispersion process; Saddlepoint approximation; Step-stress loading; Tweedie model

In order to assess the lifetime characteristics of highly reliable products, the step-stress accelerated degradation test (ADT) is a practical and effective solution, especially when there are very few items available for testing. During the past decades, the step-stress ADT has been studied by many researchers based on the assumption that the underlying degradation path follows one of the well-known but restricted stochastic processes such as Wiener, gamma, and inverse Gaussian. In practice, however, the degradation path of a product/device may not follow these specific processes, and the researchers are calling for a more flexible but unified approach toward generalized degradation models. To address this issue, the exponential dispersion process has been proposed, which is a generalized stochastic process including Wiener, gamma, and inverse Gaussian processes as special cases. In this work, we develop the step-stress ADT of products/devices when the underlying degradation path follows a class of the exponential dispersion processes. Based on this framework, the design optimization for the step-stress ADT is formulated under the C-optimality. Under the constraint that the total experimental cost does not exceed a pre-specified budget, the optimal design parameters such as measurement frequency and test termination time are determined via minimizing the approximate variance of the estimated mean time to failure of a product/device under the normal operating condition.

Authors who are presenting talks have a * after their name.

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