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Activity Details

214 Tue, 8/4/2020, 10:00 AM - 2:00 PM Virtual
Contributed Poster Presentations: Quality and Productivity Section — Contributed Poster Presentations
Quality and Productivity Section
1: Tolerance Intervals and Control Charts in Statistical Process Control
Mosab Alqurashi, The University of Alabama ASA Student Chapter; Subhabrata Chakraborti, University of Alabama
2: Effectively Applying Statistics to Accelerate Discovery and Improve Manufacturing Processes
Wenyu Su, DuPont de Nemours, Inc.; Thomas Haynes, DuPont de Nemours, Inc.; Jeffrey Wilbur, DuPont de Nemours, Inc.
3: A Process Control Model with Misclassifications and Acceptance Based on Clustering
William Griffith, University of Kentucky; Michelle Smith, Eastern Kentucky University
4: Phase I Monitoring of Univariate Processes Using Hierarchical Clustering: A Two-Step Approach with Unique Measures of Dissimilarity
Bryce Whitehead, University of Northern Colorado; Austin Brown, Kennesaw State University
5: Threshold Averaging for Peaks-Over-Threshold Extreme Value Analysis of Wind Tunnel Data
Adam Pintar, National Institute of Standards and Technology
6: A Variation on the Hit-Miss Model for Data Deduplication
Bryan Ek, NIWC Atlantic; Lucas Overbey, Naval Information Warfare Center Atlantic; Emily Nystrom, Naval Information Warfare Center Atlantic; Chris Williams, Naval Information Warfare Center Atlantic
7: A Bayesian Approach for Post-Market Safety Surveillance of New Products
Wei Zhou, Johnson & Johnson Vision; Danielle Boree, Johnson & Johnson Vision; Jiali Lin, Johnson & Johnson Vision
8: An Optimal Replacement Policy Under Sporadic Shocks and Possible Healing
Debolina Chatterjee; Jyotirmoy Sarkar, Indiana University-Purdue University Indianapolis
9: Shmoo Distance Metric with Clustering Application
Katherine Freier, Intel; Sarah Hedberg, Intel