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Abstract:
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A “shmoo” is a pass/fail heatmap type graph commonly used by electrical engineers to assess the capabilities and limitations of a device over a series of discrete conditions. They can be helpful in evaluating quality and when debugging issues, characteristics seen in shmoo plots can be key in finding both a root-cause and solution. This work describes a metric for measuring the difference between two shmoo plots and how, with that metric, variations on common clustering algorithms can be applied to efficiently group devices with similar shmoo behavior. Shmoo clustering results with example data relating to voltage and frequency of computer chips will be shared.
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