Incorporation of administrative records has long been regarded as a way of supplementing and improving the quality and interpretability of surveys. Using administrative records helps control the rising cost of surveys. The primary goal of leveraging administrative data is to improve data quality, reduce respondent burden, and minimize total survey error and cost.
This invited panel will discuss a paradigm that theorizes and implements "total administrative records error" and "total linked data error" methods and provides best practices of using administrative data over the survey life cycle. Panelists are leading scholars of administrative data, editors and chapter authors of a cutting-edge book on administrative data by Wiley (Chun, et al., forthcoming). They will discuss fundamental challenges and major advancements involved in the collection and analysis of administrative records, and innovative integration with surveys, censuses, and auxiliary data. The panel will present real-world applications of administrative records and linked data that advance survey methodology, improve official statistics, and strengthen evidence building.