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212 * Mon, 8/5/2013, 2:00 PM - 3:50 PM CC-511a
A Decade of Profile Monitoring: What's Next? — Invited Papers
Quality and Productivity Section
Organizer(s): Willis Jensen, W.L. Gore & Associates
Chair(s): Willis Jensen, W.L. Gore & Associates
2:05 PM An Overview of Profile Monitoring William H. Woodall, Virginia Tech
2:30 PM Nonparametric Profile Monitoring Peihua Qiu, University of Minnesota
2:55 PM Profile- and Surface-Monitoring Methods for Shapes Bianca Maria Colosimo, Politecnico Milano
3:20 PM Floor Discussion



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