Abstract Details
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Activity Number:
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212
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Type:
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Invited
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Date/Time:
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Monday, August 5, 2013 : 2:00 PM to 3:50 PM
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Sponsor:
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Quality and Productivity Section
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| Abstract - #307362 |
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Title:
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An Overview of Profile Monitoring
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Author(s):
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William H. Woodall*+
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Companies:
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Virginia Tech
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Keywords:
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Control Chart ;
Functional Data Analysis ;
Quality Control ;
Statistical Process Control ;
SPC
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Abstract:
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A brief historical perspective of profile monitoring, i.e., the monitoring of functions, will be given. Some of the key issues and concepts will be covered as well as a variety of examples of applications. Some practical advice will be given along with some ideas about what the future may hold for this expanding area.
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Authors who are presenting talks have a * after their name.
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