JSM 2004 - Toronto

Abstract #300069

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Activity Number: 316
Type: Invited
Date/Time: Wednesday, August 11, 2004 : 10:30 AM to 12:20 PM
Sponsor: Section on Quality and Productivity
Abstract - #300069
Title: Using Control Charts to Monitor Product and Process Quality Profiles
Author(s): William H. Woodall*+
Companies: Virginia Polytechnic Institute and State University
Address: Dept. of Statistics, Blacksburg, VA, 24061-0439,
Keywords: statistical process control ; calibration ; functional data analysis ; splines ; linear regression ; nonlinear regression
Abstract:

In most statistical process control (SPC) applications it is assumed that the quality of a process or product can be adequately represented by the distribution of a univariate quality characteristic or by the general multivariate distribution of a vector consisting of several correlated quality characteristics. In many practical situations, however, the quality of a process or product is better characterized and summarized by a relationship between a response variable and one or more explanatory variables. Thus, at each sampling stage, one observes a collection of data points that can be represented by a curve (or profile). We discuss some of the general issues involved in using control charts to monitor such process and product quality profiles and review the SPC literature on the topic. We relate this application to functional data analysis and review applications involving linear profiles, nonlinear profiles, and the use of splines and wavelets. We strongly encourage research in this area and provide some research ideas.

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Revised March 2004