JSM 2004 - Toronto

Abstract #300769

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Activity Number: 304
Type: Contributed
Date/Time: Wednesday, August 11, 2004 : 8:30 AM to 10:20 AM
Sponsor: Section on Quality and Productivity
Abstract - #300769
Title: The Normality of Flatness Measurements and The Best of k Vendors Based on CPU
Author(s): Abdelaziz Berrado*+ and Norma F. Hubele and Esma S. Gel
Companies: Arizona State University and Arizona State University and Arizona State University
Address: Dept. of Industrial Engineering, Tempe, AZ, 85287-5906,
Keywords: capability index ; vendor selection ; coefficient of variation
Abstract:

Flatness measurements are observations recorded on a quality characteristic with lower specification limit and ideal value of zero and a non-zero, positive upper specification limit. Based on the definition and operational definition of flatness in ANSI, we would anticipate that the underlying distribution of flatness measurements would be positively skewed. The analysis and fitting of 20 industrial datasets from four different processes and three different materials provide evidence that the underlying distribution is, in fact, the symmetric Gaussian distribution. As a result, the capability index CPU, which is merely a linear function of the inverse coefficient of variation, and all the associated theory supporting hypothesis testing is available. A general procedure for testing the equality of the CPUs of k independent samples is suggested.


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