JSM 2004 - Toronto

JSM Activity #304

This is the preliminary program for the 2004 Joint Statistical Meetings in Toronto, Canada. Currently included in this program is the "technical" program, schedule of invited, topic contributed, regular contributed and poster sessions; Continuing Education courses (August 7-10, 2004); and Committee and Business Meetings. This on-line program will be updated frequently to reflect the most current revisions.

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Legend: = Applied Session, = Theme Session, = Presenter
FRY = Fairmont Royal York, ICH = InterContinental Hotel, TCC = Metro Toronto Convention Center
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304 Applied Session Wed, 8/11/04, 8:30 AM - 10:20 AM TCC-801 B
Topics in Quality - Contributed - Papers
Section on Quality and Productivity
Chair(s): Angela Patterson, General Electric Company
     8:35 AM   Defects Modeling and Yield Forecasting in Semiconductor Manufacturing — Michael Baron, University of Texas, Dallas; Asya Takken, IBM Microelectronics; Emmanuel Yashchin, IBM Research; Mary Wisniewski, IBM Research Division
     8:50 AM   The Normality of Flatness Measurements and The Best of k Vendors Based on CPU — Abdelaziz Berrado, Arizona State University; Norma F. Hubele, Arizona State University; Esma S. Gel, Arizona State University
     9:05 AM   Alternative Attri-var Quality Control Schemes — Malik B. Malik, University of Maryland, Eastern Shore
     9:20 AM   Economic Design of Control Charts with Sampling Delay — Christopher A. Carolan, East Carolina University
     9:35 AM   Double Window Acceptance Sampling — Morteza Ebneshahrashoob, California State University, Long Beach; Tangan Gao, California State University, Long Beach; Milton Sobel , University of California, Santa Barbara
     9:50 AM   Floor Discussion
 

JSM 2004 For information, contact jsm@amstat.org or phone (888) 231-3473. If you have questions about the Continuing Education program, please contact the Education Department.
Revised March 2004