Abstract #301200

The views expressed here are those of the individual authors
and not necessarily those of the ASA or its board, officers, or staff.

Back to main JSM 2002 Program page
JSM 2002 Abstract #301200
Activity Number: 363
Type: Contributed
Date/Time: Wednesday, August 14, 2002 : 2:00 PM to 3:50 PM
Sponsor: Biometrics Section*
Abstract - #301200
Title: Allometric Extension for Multivariate Regression Models
Author(s): Thaddeus Tarpey*+ and Christopher Ivey
Affiliation(s): Wright State University and Blandy Experimental Farm
Address: 120 MM Building, Dayton, Ohio, 45435, USA
Keywords: principal components ; reduced rank regression ; multivariate regression
Abstract:

The two-sample allometric extension model is extended to the multivariate regression setting. In morphometric studies, where the first principal component corresponds to a size variable, the allometric extension model implies that regressor variables under consideration effect only the size of the plant and not its shape. A study of plant growth is illustrated where leaf measurements are regressed on soil variables, including contaminants. Departures from the allometric extension model imply that the contaminants effect not only the size of the leaf but also its shape. The allometric extension model for multivariate regression also provides a useful interpretation to the reduced rank regression model of rank equal to one.

  • The address information is for the authors that have a + after their name.
  • Authors who are presenting talks have a * after their name.

Back to the full JSM 2002 program

JSM 2002

For information, contact meetings@amstat.org or phone (703) 684-1221.

If you have questions about the Continuing Education program, please contact the Education Department.

Revised March 2002