Sessions Were Renumbered as of May 19.
Legend:
CC-W = McCormick Place Convention Center, West Building,
CC-N = McCormick Place Convention Center, North Building
H = Hilton Chicago,
UC = Conference Chicago at University Center
* = applied session ! = JSM meeting theme
310 *
Tue, 8/2/2016,
8:30 AM -
10:20 AM
CC-W184a
Improvements in Quality Assurance and Statistical Process Control — Contributed Papers
Quality and Productivity Section , Committee on Applied Statisticians
Chair(s): Erin Tanenbaum, NORC at the University of Chicago
8:35 AM
Sample Size Study for Measurement Systems Analysis Models
—
Laura Lancaster, SAS Institute ; Chris Gotwalt, SAS Institute
8:50 AM
Control Chart Based on Quasi-Likelihood Estimation for Monitoring Profiles
—
Chung-I Li
9:05 AM
Effects of Standard Deviation Estimation on the X-Bar Control Chart and Adjustments for a Guaranteed In-Control Performance
—
Felipe Jardim, Pontífice Universidade Católica Rio de Janeiro ; Subhabrata Chakraborti, University of Alabama ; Eugenio Epprecht, Pontífice Universidade Católica Rio de Janeiro
9:20 AM
Operating Characteristic Curves for K-Factors of Normal Tolerance Intervals
—
Derek Young, University of Kentucky
9:35 AM
The Power of Statistics to Reduce Manufacturing Costs: Optimal Inspection Interval for a Finite Population
—
Elizabeth Kelly, Los Alamos National Laboratory
9:50 AM
Comparing Binomial and Scan Statistics Methods in QC
—
Chunrong Cheng, FDA ; Boguang Zhen, FDA
10:05 AM
An Improved Method for Constructing an Upper Confidence Limit for Proportion of Nonconformance in Normal Processes
—
Yanling Zuo, Minitab
