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Sessions Were Renumbered as of May 19.

CC-W = McCormick Place Convention Center, West Building,   CC-N = McCormick Place Convention Center, North Building
H = Hilton Chicago,   UC= Conference Chicago at University Center
* = applied session       ! = JSM meeting theme

Activity Details

310 * Tue, 8/2/2016, 8:30 AM - 10:20 AM CC-W184a
Improvements in Quality Assurance and Statistical Process Control — Contributed Papers
Quality and Productivity Section , Committee on Applied Statisticians
Chair(s): Erin Tanenbaum, NORC at the University of Chicago
8:35 AM Sample Size Study for Measurement Systems Analysis Models Laura Lancaster, SAS Institute ; Chris Gotwalt, SAS Institute
8:50 AM Control Chart Based on Quasi-Likelihood Estimation for Monitoring Profiles Chung-I Li
9:05 AM Effects of Standard Deviation Estimation on the X-Bar Control Chart and Adjustments for a Guaranteed In-Control Performance Felipe Jardim, Pontífice Universidade Católica Rio de Janeiro ; Subhabrata Chakraborti, University of Alabama ; Eugenio Epprecht, Pontífice Universidade Católica Rio de Janeiro
9:20 AM Operating Characteristic Curves for K-Factors of Normal Tolerance Intervals Derek Young, University of Kentucky
9:35 AM The Power of Statistics to Reduce Manufacturing Costs: Optimal Inspection Interval for a Finite Population Elizabeth Kelly, Los Alamos National Laboratory
9:50 AM Comparing Binomial and Scan Statistics Methods in QC Chunrong Cheng, FDA ; Boguang Zhen, FDA
10:05 AM An Improved Method for Constructing an Upper Confidence Limit for Proportion of Nonconformance in Normal Processes Yanling Zuo, Minitab
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