Sessions Were Renumbered as of May 19.
Legend:
CC-W = McCormick Place Convention Center, West Building,
CC-N = McCormick Place Convention Center, North Building
H = Hilton Chicago,
UC = Conference Chicago at University Center
* = applied session ! = JSM meeting theme
340 * !
Tue, 8/2/2016,
10:30 AM -
12:20 PM
CC-W179a
Statistical Issues in Large-Scale Quality Control Systems — Topic Contributed Papers
Quality and Productivity Section
Organizer(s): Emmanuel Yashchin, IBM Research
Chair(s): Emmanuel Yashchin, IBM Research
10:35 AM
Sequential Detection of Cyber-Physical Attacks on Industrial Systems
—
Igor Nikiforov, ICD/LM2S, Université de Technologie de Troyes ; Van Long Do, ICD/LM2S, Université de Technologie de Troyes ; Lionel Fillatre, I3S, Université de Nice Sophia Antipolis
10:55 AM
Quality Engineering Faces the Challenges of Big Data and Little Data
—
Fugee Tsung, The Hong Kong University of Science and Technology
11:15 AM
Mixture of Forecasting Models with an Application on Solar Energy Forecasting
—
YoungDeok Hwang, IBM T. J. Watson Research Center ; Siyuan Lu, IBM T. J. Watson Research Center ; Eric Wang, Duke University
11:35 AM
Pipeline Analytics for Demand Forecasting
—
Ta-Hsin Li, IBM T. J. Watson Research Center
11:55 AM
Wafer Tomography: Study of Defects and Prediction of Integrated-Circuit Yield
—
Michael Baron, American University ; Emmanuel Yashchin, IBM Research
12:15 PM
Floor Discussion
