Online Program Home
My Program

Abstract Details

Activity Number: 511 - Statistical Applications in the Physical Sciences
Type: Contributed
Date/Time: Wednesday, July 31, 2019 : 10:30 AM to 12:20 PM
Sponsor: Section on Physical and Engineering Sciences
Abstract #304559
Title: Using correlated binomial distribution in estimating error rates for forensic firearm identification
Author(s): Nien-Fan Zhang*
Companies: NIST
Keywords: Ballistic signatures; Bernoulli trials; forensic science; maximum likelihood estimation; nonlinear regression
Abstract:

Estimating error rates for firearm evidence identification is a fundamental challenge in forensic science. The recently developed Congruent Matching Cells (CMC) method provides applications to firearm evidence identification. To estimate error rates, appropriate statistical models are needed for the CMC values. In this paper, in addition to the binomial probability distribution the correlated binomial distribution is proposed. For an image comparison, correlated binomial distribution can be applied to the cell pairs from CMC method. An application to an actual data set demonstrates that the correlated binomial distribution fits the relative frequency distribution of CMC values much better than the binomial distribution.


Authors who are presenting talks have a * after their name.

Back to the full JSM 2019 program