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Activity Number: 187 - Contributed Poster Presentations: Section on Nonparametric Statistics
Type: Contributed
Date/Time: Monday, July 29, 2019 : 10:30 AM to 12:20 PM
Sponsor: Section on Nonparametric Statistics
Abstract #304492
Title: Empirical Likelihood Ratio Tests with Power One
Author(s): Li Zou* and Albert Vexler
Companies: California State University, East Bay. and The State University of New York at Buffalo
Keywords: Power one; t-statistic; Sequential tests; Empirical likelihood; Law of the iterated logarithm

In the 1970s, Professor Robbins and his coauthors extended the Vile and Wald inequality in order to derive the fundamental theoretical results regarding likelihood ratio based sequential tests with power one. The law of the iterated logarithm confirms an optimal property of the power one tests. In parallel with Robbins’s decision-making procedures, we propose and examine sequential empirical likelihood ratio (ELR) tests with power one. In this setting, we develop the nonparametric one- and two-sided ELR tests. It turns out that the proposed sequential ELR tests significantly outperform the classical nonparametric t-statistic-based counterparts in many scenarios based on different underlying data distributions.

Authors who are presenting talks have a * after their name.

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