Activity Number:
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214
- Combinatorial Testing: Using Covering Arrays to Maximize the Impact of Testing
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Type:
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Invited
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Date/Time:
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Monday, July 29, 2019 : 2:00 PM to 3:50 PM
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Sponsor:
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Section on Physical and Engineering Sciences
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Abstract #300176
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Title:
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Analysis and Evaluation of Covering Arrays Using Prior Information
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Author(s):
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Ryan Lekivetz* and Joseph Morgan
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Companies:
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JMP Division of SAS and JMP Division of SAS
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Keywords:
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Design of Experiments;
Covering Arrays;
Combinatorial Testing
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Abstract:
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Covering arrays are a powerful tool for determining test cases for testing complex engineered systems. The primary appeal of using covering arrays for this purpose is that they are a cost-efficient way to construct test cases that are effective at precipitating failures that are due to the combination of several inputs. However, when failures occur, a test engineer is tasked with determining the inputs that triggered the failures, which typically involves evaluating a large list of potential or performing a number of follow-up tests. In this talk we discuss a method that allows a test engineer to efficiently analyze the outcomes of a set of test cases by making use of prior knowledge about the system under test. This analysis provides a ranking of input combinations that potentially triggered the failures. The same mechanism for specifying the prior knowledge can also be used in ranking or creating covering arrays before any data is collected.
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Authors who are presenting talks have a * after their name.