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Activity Number:
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188
- Contributed Poster Presentations: Section on Nonparametric Statistics
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Type:
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Contributed
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Date/Time:
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Monday, July 30, 2018 : 10:30 AM to 12:20 PM
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Sponsor:
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Section on Nonparametric Statistics
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Abstract #330813
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Title:
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Simultaneous Confidence Intervals for Scale Using Permutation Tests
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Author(s):
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Scott Richter* and Melinda McCann
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Companies:
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University of North Carolina At Greensboro and Oklahoma State University
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Keywords:
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permutation test;
scale parameter;
deviance
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Abstract:
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A method for computing simultaneous pairwise confidence intervals, based on the ratio of deviances, is proposed for pairwise comparison of scale. The Tukey-type adjustment of Richter & McCann (2007) is employed to guarantee strong Type I error rate control. Power and Type I error rate estimates are computed using simulated data, and compared to those for previously proposed methods.
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Authors who are presenting talks have a * after their name.
