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Activity Number: 289 - Advancement in Statistical Methods for Reliability Data
Type: Topic Contributed
Date/Time: Tuesday, July 31, 2018 : 8:30 AM to 10:20 AM
Sponsor: Section on Physical and Engineering Sciences
Abstract #328910 Presentation
Title: Planning of Accelerated Degradation Tests
Author(s): I-Chen Lee*
Companies: National Cheng Kung University
Keywords: Accelerated degradation test
Abstract:

The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. Because conducting an ADT is very expensive, how to plan an ADT is a challenging issue for reliability analysts. By taking the experimental cost into consideration, this study proposes an efficient algorithm to determine the total sample size, testing stress levels, the measurement frequencies, and the number of measurements based on a class of exponential dispersion (ED) degradation models. For an ADT plan, the proposed method provides some design insights, and we further discuss the properties from the viewpoints of design.


Authors who are presenting talks have a * after their name.

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