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Activity Number: 253 - Contributed Poster Presentations: Section on Statistical Computing
Type: Contributed
Date/Time: Monday, July 30, 2018 : 2:00 PM to 3:50 PM
Sponsor: Section on Statistical Computing
Abstract #328609
Title: Package MTEXO for Testing the Presence of Outliers in Exponential Samples
Author(s): Chien-Tai Lin*
Companies: Tamkang University
Keywords: Critical value; discordancy test; exponential distribution; spacings; user interface

We develop a user-interface package mTEXO in the maplet application for testing exponential upper and/or lower outliers. The distributions of some well-known test statistics for exponential outliers in the literature can be easily evaluated using mTEXO, saving considerable computational time performing numerical integrations and combinatorial algebra necessary in the traditional approach.

Authors who are presenting talks have a * after their name.

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