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Activity Number: 324 - Leading with Statistics: Process Monitoring and Improvement
Type: Invited
Date/Time: Tuesday, July 31, 2018 : 10:30 AM to 12:20 PM
Sponsor: Quality and Productivity Section
Abstract #326496 Presentation
Title: Using Baseline Data in Process Improvement
Author(s): Stefan Steiner* and Jock MacKay
Companies: University of Waterloo and University of Waterloo
Keywords: experimental design; process monitoring; SPC; measurement system assessment

For many existing industrial/business processes data on responses of interest are routinely collected. In this talk we explore and quantify the benefits of using this "free" baseline data to improve both the planning and analysis of process monitoring charts, measurement system assessment studies and designed experiments.

Authors who are presenting talks have a * after their name.

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