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Activity Details

339 Tue, 8/1/2017, 10:30 AM - 12:20 PM CC-330
Model-Fitting, Likelihood-Based Inference, and Their Applications — Contributed Papers
Chair(s): Grace Li, Eli Lilly and Company
10:35 AM On the Properties of the Gradient of Log Empirical Likelihood Sanjay Chaudhuri, National University of Singapore
10:50 AM Robust Tests Using a Divergence Measure Abhijit Mandal, Wayne State University ; Ayanendranath Basu, Indian Statistical Institute ; Leandro Pardo, Complutense University of Madrid ; Nirian Martin, Complutense University of Madrid
11:05 AM Different Paradigms of Interpretation for Forensic Value of Evidence Quantification Danica Ommen, South Dakota State University ; Christopher Saunders, South Dakota State University ; Reinoud Stoel, Netherlands Forensic Institute ; Peter Vergeer, Netherlands Forensic Institute
11:20 AM Robustness of Lognormal Confidence Regions for Means of Symmetric Positive Matrices Benoit Ahanda, Texas Tech University ; Daniel E Osborne, Florida A&M University ; Leif Ellingson, Texas Tech University
11:50 AM Floor Discussion
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