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Activity Number: 521 - Contributed Poster Presentations: Quality and Productivity Section
Type: Contributed
Date/Time: Wednesday, August 2, 2017 : 10:30 AM to 12:20 PM
Sponsor: Quality and Productivity Section
Abstract #325440
Title: Optimal step-stress accelerated life test under Type-I censoring with flexible stress durations
Author(s): Tianyu Bai* and David Han
Companies: University of Texas at San Antonio and University of Texas At San Antonio
Keywords: accelerated life test ; cumulative exposure model ; flexible stress duration ; optimal regression design ; order statistics ; step-stress loading
Abstract:

To collect the information about the lifetime distribution of a product, a standard life testing method at normal operating conditions is not practical when the product has a substantially long lifespan. Accelerated life tests solve this problem by subjecting the test items at higher stress levels for quicker and more failure data. This paper investigates the optimal stress durations for a simple step-stress accelerated life test under Type-I censoring. The determination of the optimal step durations is discussed under several well-known optimality criteria, including C-optimality, D-optimality, and A-optimality. For an exponential population with a single stress variable, the efficiencies of the optimal designs with flexible step durations and uniform step durations are compared through a numerical study and a real case study.


Authors who are presenting talks have a * after their name.

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