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Activity Number: 240 - Computationally Intensive Methods for Estimation and Inference
Type: Contributed
Date/Time: Monday, July 31, 2017 : 2:00 PM to 3:50 PM
Sponsor: Section on Statistical Computing
Abstract #324531 View Presentation
Title: A Novel Exact Method for Significance of Higher Criticism via Steck's Determinant
Author(s): Jeffrey Miecznikowski* and Jiefei Wang and Daniel Gaile and David Tritchler
Companies: SUNY At Buffalo and SUNY University at Buffalo and SUNY University at Buffalo and SUNY University at Buffalo
Keywords: Higher criticism ; Steck's determinant ; multiple testing
Abstract:

We provide a novel straightforward approach to calculating the significance for higher criticism statistics using a general result due to Steck (1971) coined Steck's determinant. This result allows users to directly assess higher criticism significance without the need for simulation or asymptotic results.


Authors who are presenting talks have a * after their name.

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