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Sessions Were Renumbered as of May 19.

CC-W = McCormick Place Convention Center, West Building,   CC-N = McCormick Place Convention Center, North Building
H = Hilton Chicago,   UC= Conference Chicago at University Center
* = applied session       ! = JSM meeting theme

Activity Details

645 * Thu, 8/4/2016, 8:30 AM - 10:20 AM CC-W175c
Maintenance, Monitoring, and Inference: Different Aspects of Reliability Modeling in Industrial Applications — Topic Contributed Papers
Quality and Productivity Section , Section on Physical and Engineering Sciences
Organizer(s): Ananda Sen, University of Michigan
Chair(s): Nandini Kannan, National Science Foundation
8:35 AM The EM Algorithm for One-Shot Device Testing with Competing Risk Under Different Lifetimes Distributions Hon Yiu So, McMaster University ; Narayanaswamy Balakrishnan, McMaster University ; Man Ho Ling, Hong Kong Institute of Education
8:55 AM Degradation and Maintenance Modeling Using the Inverse Gaussian Process Bo Henry Lindqvist, Norwegian University of Science and Technology ; Odd Eirik Farestveit, Accenture
9:15 AM Reliability Monitoring in a Mass-Production Environment Emmanuel Yashchin, IBM Research
9:35 AM Discussant: Ravindra Khattree, Oakland University
9:55 AM Floor Discussion
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