JSM 2015 Online Program

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Legend: Washington State Convention Center = CC, Sheraton Seattle = S, Grand Hyatt = GH and The Conference Center = TCC
* = applied session       ! = JSM meeting theme

Activity Details

612 * ! Wed, 8/12/2015, 2:00 PM - 3:50 PM TCC-204
Product Reliability and Life Testing — Contributed Papers
Quality and Productivity Section , International Chinese Statistical Association , Section on Physical and Engineering Sciences
Chair(s): William Meeker, Iowa State University
2:05 PM A Study of Degradation Data with Measurement Errors Chien-Yu Peng, Institute of Statistical Science, Academia Sinica
2:20 PM Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process Chih-Chun Tsai ; Chien-Tai Lin, Tamkang University ; Narayanaswamy Balakrishnan, McMaster University
2:35 PM Lower Tolerance Bounds in Accelerated Life Testing for the Weibull Distribution Ananda Jayawardhana, Pittsburg State University ; V.A. Samaranayake, Missouri University of Science and Technology
2:50 PM Mixture of Failure Rates in Quadratic Form Yi-Kuan Jong, St. John's University
3:05 PM Estimating Latent Ability from the Nondestructive Test Results When the Test Items Difficulties Are Unknown Beforehand Emil Bashkansky, ORT Braude College ; Vladimir Turetsky, ORT Braude College
3:20 PM Cluster Analysis for Facies Grouping Mingqi Wu, Shell Global Solutions (U.S.) Inc.
3:35 PM A Two-Threshold Replacement Policy for a Two-Unit System with Failure Interaction Shey-Huei Sheu, Providence Univesrity ; Tzu-Hsin Liu, Providence University ; Zhe-George Zhang, Western Washington University ; Hsin-Nan Tsai, Providence University

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