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Legend: Boston Convention & Exhibition Center = CC, Westin Boston Waterfront = W, Seaport Boston Hotel = S
A * preceding a session name means that the session is an applied session.
A ! preceding a session name means that the session reflects the JSM meeting theme.

Activity Details

446 * Wed, 8/6/2014, 8:30 AM - 10:20 AM CC-203
Novel Contexts for SPC Methodology and Applications — Topic Contributed Papers
Quality and Productivity Section , Section on Physical and Engineering Sciences
Organizer(s): Daniel Jeske, University of California, Riverside
Chair(s): Ming Li, REANCON.COM   
8:35 AM Statistical Process Control for Reliability Assurance of Devices in Long Term Storage Alix Robertson, Sandia National Laboratories
8:55 AM Spc Methods for Non-Stationary Correlated Count Data with Applications to Network Surveillance Daniel Jeske, University of California, Riverside ; Yingzhuo Fu, MarketResearch
9:15 AM A Robust Phase I Ewma Chart for Dispersion Ronald Does, University of Amsterdam ; Inez Zwetsloot, University of Amsterdam ; Marit Schoonhoven, University of Amsterdam
9:35 AM Quality Control Charts for Generalized Exponential Lifetime Percentiles Trenton Brown ; Yuhlong Lio, University of South Dakota ; Nan Jiang, University of South Dakota
9:55 AM Discussant: Ron Fricker, Post Naval Graduate School
10:15 AM Floor Discussion

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