Abstract Details
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Activity Number:
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360
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Type:
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Roundtables
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Date/Time:
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Tuesday, August 5, 2014 : 12:30 PM to 1:50 PM
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Sponsor:
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Quality and Productivity Section
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Abstract #313299
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Title:
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Pitfalls of Accelerated Testing
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Author(s):
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Scott Vander Wiel*+ and Brian Weaver*+
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Companies:
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Los Alamos National Laboratory and Los Alamos National Observatory
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Keywords:
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Reliability ;
Accelerated Testing ;
Extrapolation ;
Accelerated Degradation
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Abstract:
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Accelerated testing is commonly used by industrial and research institutions to predict long-term failure rates under various use conditions. Good predictions of reliability are obviously valuable, but accelerated testing has many potential pitfalls, as discussed in two papers by W.Q. Meeker and coauthors. We will discuss lessons learned from accelerated tests, including our own experiences at Bell Laboratories and Los Alamos National Laboratory.
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Authors who are presenting talks have a * after their name.
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