Abstract Details
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Activity Number:
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99
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Type:
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Invited
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Date/Time:
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Monday, August 4, 2014 : 8:30 AM to 10:20 AM
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Sponsor:
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Section on Physical and Engineering Sciences
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Abstract #310762
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View Presentation
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Title:
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Assessing Reliability of DoD Systems: Bayesian Assimilation Models and Methodologies in Reliability Growth Applications
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Author(s):
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Ananda Sen *+
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Companies:
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University of Michigan
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Keywords:
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Reliability Growth ;
Bayesian Assimilation ;
Developmental Testing ;
Defense Systems ;
Multiple Failure Modes
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Abstract:
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As a developmental system progresses through the stages of U.S. Department of Defense (DoD) acquisition processes, its physical design evolves and matures over time in response to failure modes exhibited in testing. A dynamic Bayesian formulation is envisioned that connects the successive stages of developmental testing closely while allowing for either growth or decay in reliability. The Bayesian approach further offers prospects for assimilating information from different testing regimes, e.g., developmental tests of early system versions and more operationally relevant tests of mature systems. We discuss some existing methodologies in this context and present some alternatives that have promises to provide a realistic depiction of the DoD acquisition process.
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Authors who are presenting talks have a * after their name.
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