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Activity Details


426 * Tue, 8/6/2013, 2:00 PM - 3:50 PM CC-512h
Statistical Process Control (SPC) — Contributed Papers
Quality and Productivity Section , Section on Statistical Graphics , Korean International Statistical Society
Chair(s): Sarah Kalicin, Intel Corporation
2:05 PM Monitoring Change Point for Diffusion Parameter Based on Discretely Observed Sample from SDE Models Meihui Guo, National Sun Yat-Sen University ; Sangyeol Lee, Seoul National University
2:20 PM SPC Charts for Detecting Shifts in Variance with Autocorrelated Data Nien-Fan Zhang, NIST ; Adam L. Pintar, NIST
2:35 PM A Generalized Statistical Control Chart for Over- or Under-Dispersed Data Kimberly Sellers, Georgetown University
2:50 PM A GLR Control Chart for Monitoring the Process Mean with Sequential Sampling Yiming Peng, Virginia Tech ; Marion Reynolds, Virginia Tech
3:05 PM A GLR Chart for Monitoring a Proportion with Autocorrelation Ning Wang, Virginia Tech ; Marion Reynolds, Virginia Tech
3:20 PM Another Look at Run-Length Distributions Wei Wang, PSU ; Dennis Kon-Jin Lin, The Pennsylvania State University
3:35 PM SPC Data Visualization of Seasonal Data Annie Dudley Zangi, SAS Institute ; Diane K. Michelson, SAS



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