Abstract Details
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Activity Number:
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425
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Type:
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Contributed
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Date/Time:
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Tuesday, August 6, 2013 : 2:00 PM to 3:50 PM
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Sponsor:
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Section on Physical and Engineering Sciences
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| Abstract - #310294 |
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Title:
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Some Aspects of Series System Reliability Estimation
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Author(s):
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Emmanuel Yashchin*+
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Companies:
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IBM Corporation
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Keywords:
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Life testing ;
Extreme value theory ;
Weakest link models ;
Product qualification ;
Failure mechanisms
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Abstract:
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We discuss the situation when the number of components in a series system is unknown and needs to be estimated from repeated series lifetime tests. This type of "weakest link" models is relevant in cases when tests for an individual component are unfeasible, and so inference needs to be done based on chains of different sizes. Since the number of components in such chains is unknown, it needs to be estimated along with lifetime parameters of an individual component. The paper focuses on inferential issues in such models and discusses a number of examples from semiconductor industry.
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Authors who are presenting talks have a * after their name.
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