Abstract Details
|
Activity Number:
|
698
|
|
Type:
|
Contributed
|
|
Date/Time:
|
Thursday, August 8, 2013 : 10:30 AM to 12:20 PM
|
|
Sponsor:
|
SSC
|
| Abstract - #309162 |
|
Title:
|
A Formal Test for Binary R&R Measurement System
|
|
Author(s):
|
Vahid Partovi Nia*+ and Masoud Asgharian and Samuel Basetto
|
|
Companies:
|
École Polytechnique Montréal and McGill University and Ecole Polytechnique de Montreal
|
|
Keywords:
|
Attribute gauge R&R ;
Measurement systems analysis ;
Pearson goodness of fit statsitic ;
Kappa measure of agreement
|
|
Abstract:
|
Measurement systems studies are an integral part of most quality improvement processes. A desirable measurement system must produce repeatable and reproducible values, such measurement systems are called R&R. Statistical test of R&R, despite its importance, is less studied and no formal statistical test is proposed for widely applied attribute measurement systems. We propose a statistical test of R&R for an attribute gauge allowing implementation of a significance test. The efficiency of the methodology is demonstrated on an example.
|
Authors who are presenting talks have a * after their name.
Back to the full JSM 2013 program
|
2013 JSM Online Program Home
For information, contact jsm@amstat.org or phone (888) 231-3473.
If you have questions about the Continuing Education program, please contact the Education Department.
The views expressed here are those of the individual authors and not necessarily those of the JSM sponsors, their officers, or their staff.
Copyright © American Statistical Association.