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Abstract Details
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Activity Number:
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421
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Type:
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Contributed
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Date/Time:
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Tuesday, July 31, 2012 : 2:00 PM to 3:50 PM
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Sponsor:
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Section on Statistics in Defense and National Security
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| Abstract - #306623 |
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Title:
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Sequential Design Methods for Reliability Sensitivity Testing
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Author(s):
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Elise Roberts*+ and Joseph Davis Warfield and Anindya Roy
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Companies:
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The Johns Hopkins University Applied Physics Laboratory and The Johns Hopkins University Applied Physics Laboratory and University of Maryland Baltimore County
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Address:
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11100 Johns Hopkins Road, Laurel, MD, 20723, United States
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Keywords:
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Binary regression ;
Reliability sensitivity testing ;
Dose-response
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Abstract:
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There is considerable interest in binary response experiments to learn about the sensitivity of a new explosive as a function of some stimulus, or the toxicity of a drug administered at different dose levels. The traditional method for selecting stimulus levels for explosives is the Langlie One-Shot Method which seeks out the stimulus level that is a median for the underlying cumulative distribution function. We provide a modification to this method to seek out the stimulus level for any quantile of interest from the underlying cumulative distribution function. A comparison of the modified method along with existing methods using Monte Carlo simulation is presented.
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