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Abstract Details

Activity Number: 430
Type: Roundtables
Date/Time: Wednesday, August 1, 2012 : 7:00 AM to 8:15 AM
Sponsor: Section on Physical and Engineering Sciences
Abstract - #306554
Title: Statistical Analysis of Modern Reliability Data
Author(s): Yili Hong*+
Companies: Virginia Tech
Address: 213 Hutcheson Hall, Blacksburg, VA, 24060,
Keywords: Accelerated failure time model ; Cumulative exposure model ; Dynamic data ; Lifetime data ; Usage history ; Warranty returns
Abstract:

Traditional reliability data are mainly obtained from laboratory tests and warranty databases, giving failure-time or system performance information. Modern technology, such as smart chips and sensors, is changing the data collection process. Systems installed with automatic data-collecting devices are ranging from complex systems, such as jet engines, modern locomotive engines, wind turbines, high voltage power transformers and CAT scanners, to consumer products, such as automobiles, high-end copier machines, and smart phones. For these systems and products, usage, system degradation and environmental information is dynamically recorded and transmitted back to manufacturers, over the network, with owners' permissions. The arriving generation of reliability field data will contain richer information. This roundtable will have discussions on the opportunities and challenges in analyzing dynamic reliability data, providing information that is critical for assets management, capital expenditures, maintenance scheduling, and risk control. We hope to create a bridge between the academia and industry, which will enhance further communication in this area.


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