JSM 2012 Home

JSM 2012 Online Program

The views expressed here are those of the individual authors and not necessarily those of the JSM sponsors, their officers, or their staff.

Online Program Home

Abstract Details

Activity Number: 186
Type: Contributed
Date/Time: Monday, July 30, 2012 : 10:30 AM to 12:20 PM
Sponsor: Social Statistics Section
Abstract - #306510
Title: Hosmer-Lemeshow Goodness-of-Fit Test for Multiply Imputed Data
Author(s): Danielle Sullivan*+ and Rebecca Andridge
Companies: and The Ohio State University
Address: 100 North St, Columbus, OH, 43202, United States
Keywords: Multiple Imputation ; Hosmer-Lemeshow Goodness of Fit
Abstract:

The Hosmer-Lemeshow (H-L) test is widely used for evaluating goodness of fit in logistic regression models. The H-L test first creates groups based on deciles of the estimated probabilities and then compares observed and expected event rates within these groups. Multiple imputation (MI) is growing in popularity as a method for handling missing data, and how to apply the H-L test after MI is not straightforward. In this paper we discuss complexities involved in applying the H-L test to multiply imputed data, related to which variables have missingness. When covariates have been imputed, predicted probabilities vary across imputed data sets, and thus the boundaries of the predicted probability groupings vary as well. When the outcome has been imputed, both predicted probabilities and "observed" event rates change from one data set to the next. We then propose several different methods for using the H-L test with multiply imputed data, and compare the methods through simulation.


The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.

Back to the full JSM 2012 program




2012 JSM Online Program Home

For information, contact jsm@amstat.org or phone (888) 231-3473.

If you have questions about the Continuing Education program, please contact the Education Department.