JSM 2012 Home

JSM 2012 Online Program

The views expressed here are those of the individual authors and not necessarily those of the JSM sponsors, their officers, or their staff.

Online Program Home

Abstract Details

Activity Number: 628
Type: Contributed
Date/Time: Thursday, August 2, 2012 : 8:30 AM to 10:20 AM
Sponsor: Biometrics Section
Abstract - #306237
Title: Empirical Bayes Methods for Large-Scale Risk Prediction on Mini-Exome Sequence Data
Author(s): Gengxin Li*+ and Hongyu Zhao
Companies: Yale University and Yale School of Public Health
Address: 905 Mix Ave,, Hamden, CT, 06514, United States
Keywords: Empirical Bayes ; Risk Prediction ; Random Forest ; Neural Network
Abstract:

We consider the application of an Empirical Bayes Classification method, originally proposed by Efron, to Genome-Wide Association Study risk prediction using the exome sequence data. A major advantage of using this method is that the effect size distribution for the set of possible features is empirically estimated and all subsequent parameter estimation and risk prediction is guided by this distribution. Here, we generalize the Efron's method to allow for some of the peculiarities of this data. In particular, we introduce two ways of extending Efron's model: Weighted Empirical Bayes Model and Joint Covariance Model that allow the model to properly incorporate the annotation information of single nucleotide polymorphisms (SNPs). In the course of our analysis, several aspects of the possible simulation model are examined, including the identity of the most important genes, the differing effects of Synonymous and Non-synonymous SNPs, and the relative roles of covariates and genes in conferring disease risk. Finally, three methods addressed here are compared to each other as well as to other Classifiers (Random Forest and Neural Network).


The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.

Back to the full JSM 2012 program




2012 JSM Online Program Home

For information, contact jsm@amstat.org or phone (888) 231-3473.

If you have questions about the Continuing Education program, please contact the Education Department.