The views expressed here are those of the individual authors and not necessarily those of the JSM sponsors, their officers, or their staff.
Online Program Home
Abstract Details
Activity Number:
|
239
|
Type:
|
Contributed
|
Date/Time:
|
Monday, July 30, 2012 : 2:00 PM to 3:50 PM
|
Sponsor:
|
Quality and Productivity Section
|
Abstract - #305385 |
Title:
|
Conditional Confidence Intervals of the Process Capability Index Cpk
|
Author(s):
|
Chien-Pai Han*+ and Jianchun Zhang
|
Companies:
|
The University of Texas and The University of Texas at Arlington
|
Address:
|
P.O. Box 19408, Arlington, TX, 76019-0001, United States
|
Keywords:
|
Preliminary test ;
conditional confidence interval ;
process capability index ;
length of interval ;
coverage probability
|
Abstract:
|
The process capability index Cpk involves the process mean µ and the process standard deviation s. When µ and s are unknown we can estimate them by a random sample. When we have uncertain prior information about their values, we may check the uncertain prior information by preliminary tests. Then we can construct a conditional confidence interval of the process capability index Cpk following rejection of the preliminary tests. In this paper, we adopt two tests for testing µ and s separately and sequentially, instead of testing µ and s jointly. Conditional confidence intervals of Cpk following different results of the two tests are provided. For the case that both of the two null hypotheses are rejected, we construct the confidence interval of Cpk for which the two parameters µ and s are all unknown. An extension of the general method for finding a confidence interval of an unknown quant
|
The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.
Back to the full JSM 2012 program
|
2012 JSM Online Program Home
For information, contact jsm@amstat.org or phone (888) 231-3473.
If you have questions about the Continuing Education program, please contact the Education Department.