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Abstract Details
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Activity Number:
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126
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Type:
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Contributed
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Date/Time:
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Monday, July 30, 2012 : 8:30 AM to 10:20 AM
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Sponsor:
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Section on Statistical Computing
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| Abstract - #304946 |
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Title:
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Planning Step-Stress Test Plans Under Type-I Censoring for the Log-Location-Scale Case
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Author(s):
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Chien-Tai Lin*+ and Cheng-Chieh Chou and N. Balakrishnan
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Companies:
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Tamkang University and Tamkang University and McMaster University
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Address:
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Department of Mathematics, Tamsui 251, , Taiwan, Republic of China
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Keywords:
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Accelerated life-testing ;
Variance-optimality criterion ;
Maximum likelihood estimation
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Abstract:
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In this paper, we consider a k-step-stress accelerated life-testing (ALT) experiment with unequal duration steps. Censoring is allowed only at the change-stress point in the final stage. A general log-location-scale lifetime distribution with mean life which is a linear function of stress, along with a cumulative exposure model, is considered as the working model. Under this model, the determination of the optimal choice of unequal duration steps for both Weibull and lognormal distributions are addressed using variance-optimality criterion. Numerical results show that for a general log-location-scale distributions, the optimal k-step-stress ALT model with unequal duration steps reduces just to a 2-step-stress ALT model.
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