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Abstract Details
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Activity Number:
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18
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Type:
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Topic Contributed
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Date/Time:
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Sunday, July 29, 2012 : 2:00 PM to 3:50 PM
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Sponsor:
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Quality and Productivity Section
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| Abstract - #304632 |
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Title:
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The Interplay Between Failure Time and Degradation Data Analyses: A Case Study
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Author(s):
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Necip Doganaksoy*+
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Companies:
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Address:
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9 Jordan Lane, Glenville, NY, 12302, United States
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Keywords:
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Accelerated testing ;
Failure mechanism ;
Degradation path ;
Weibull distribution
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Abstract:
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The traditional focus in reliability literature has been on analysis and modeling of lifetime (or time to failure) data. In recent years the attention has shifted to degradation data. It has been shown that degradation measurements are especially useful when very few or no failures have been observed. This presentation is based on a case study involving a new battery for backup power applications. An accelerated life test was run on battery cells to collect both lifetime and degradation data. We will illustrate the advantages offered by degradation towards exploring physical failure mechanisms more directly than lifetime data and, therefore, providing increased insights.
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The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.
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