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Abstract Details
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Activity Number:
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136
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Type:
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Contributed
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Date/Time:
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Monday, July 30, 2012 : 8:30 AM to 10:20 AM
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Sponsor:
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Quality and Productivity Section
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| Abstract - #304411 |
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Title:
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Applied Bayesian Analysis for Reliability Problems
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Author(s):
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Ming Li*+
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Companies:
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GE Global Research
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Address:
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Applied Statistics Lab, Niskayuna, NY, , USA
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Keywords:
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Reliability ;
Bayesian Analysis ;
Informative Prior
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Abstract:
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In this talk, several reliability problems are solved through Bayesian computation software WinBUGs/OpenBUGs. Informative prior distributions through experts' engineering knowledge are used in the Bayesian analysis. The results from the informative priors and non-informative priors are compared. Several technical points of how to leverage WinBUGs/OpenBUGs functions for reliability problems are also discussed. This is a joint work with William Q. Meeker at Department of Statistics, Iowa State University.
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The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.
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