JSM 2012 Home

JSM 2012 Online Program

The views expressed here are those of the individual authors and not necessarily those of the JSM sponsors, their officers, or their staff.

Online Program Home

Abstract Details

Activity Number: 437
Type: Invited
Date/Time: Wednesday, August 1, 2012 : 8:30 AM to 10:20 AM
Sponsor: ENAR
Abstract - #303841
Title: Batch Effects from Biological and Technological Artifacts in High-Throughput Data Collections
Author(s): Jeffrey Leek*+
Companies: The Johns Hopkins University
Address: , Baltimore, MD, ,
Keywords: TCGA ; batch effects ; prediction ; sequencing ; microarray ; surrogate variable analysis

Batch effects are present in any large scale study in which all the samples cannot be collected and processed at a single time. In this talk we will examine the batch effects that have been detected in TCGA data and how to identify and adjust for their effects on analysis. We will show this problem is not exclusive to the TCGA data and affects nearly every high-throughput data analysis. We will show that "batch effects" may be due to both latent technological and biological variation. We will discuss appropriate batch correction for both prediction and epidemiological analysis. Though large data resources are becoming readily available it is important to be aware of their limitations and potential bias so that valid conclusions can be drawn.

The address information is for the authors that have a + after their name.
Authors who are presenting talks have a * after their name.

Back to the full JSM 2012 program

2012 JSM Online Program Home

For information, contact jsm@amstat.org or phone (888) 231-3473.

If you have questions about the Continuing Education program, please contact the Education Department.